JPH0242435U - - Google Patents
Info
- Publication number
- JPH0242435U JPH0242435U JP12237488U JP12237488U JPH0242435U JP H0242435 U JPH0242435 U JP H0242435U JP 12237488 U JP12237488 U JP 12237488U JP 12237488 U JP12237488 U JP 12237488U JP H0242435 U JPH0242435 U JP H0242435U
- Authority
- JP
- Japan
- Prior art keywords
- probe card
- semiconductor device
- substrate
- wiring pattern
- bump electrodes
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
- 239000000523 sample Substances 0.000 claims description 12
- 239000000758 substrate Substances 0.000 claims description 5
- 239000004065 semiconductor Substances 0.000 claims description 3
- 239000011521 glass Substances 0.000 claims description 2
- 238000010586 diagram Methods 0.000 description 4
- 238000007689 inspection Methods 0.000 description 2
- 238000000034 method Methods 0.000 description 2
Landscapes
- Measuring Leads Or Probes (AREA)
- Testing Or Measuring Of Semiconductors Or The Like (AREA)
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP12237488U JPH0242435U (en]) | 1988-09-19 | 1988-09-19 |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP12237488U JPH0242435U (en]) | 1988-09-19 | 1988-09-19 |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| JPH0242435U true JPH0242435U (en]) | 1990-03-23 |
Family
ID=31370246
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP12237488U Pending JPH0242435U (en]) | 1988-09-19 | 1988-09-19 |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPH0242435U (en]) |
-
1988
- 1988-09-19 JP JP12237488U patent/JPH0242435U/ja active Pending
Similar Documents
| Publication | Publication Date | Title |
|---|---|---|
| JP2890442B2 (ja) | 半導体装置のコンタクトホールの目ずれ検査方法 | |
| JPH0242435U (en]) | ||
| JPS61179747U (en]) | ||
| JPS5849637Y2 (ja) | 厚膜配線板 | |
| JPH0526752Y2 (en]) | ||
| JPS6429826U (en]) | ||
| JPS6397237U (en]) | ||
| JPS62140734U (en]) | ||
| JPH01130534U (en]) | ||
| JPS6433745U (en]) | ||
| JPS6186970U (en]) | ||
| JPS61177479U (en]) | ||
| JPS6122370U (ja) | 光起電力素子 | |
| JPH02137035U (en]) | ||
| JPS6384946U (en]) | ||
| JPH04170044A (ja) | 半導体ウェーハの検査用治具 | |
| JPS63136336U (en]) | ||
| JPH0328465U (en]) | ||
| JPH01146559U (en]) | ||
| JPH0270441U (en]) | ||
| JPH0195738U (en]) | ||
| JPS61199681U (en]) | ||
| JPS63131131U (en]) | ||
| JPH0321860U (en]) | ||
| JPS6115736U (ja) | プロ−ブカ−ド |